On the Design of Fast , Easily Testable ALU

نویسنده

  • John P. Hayes
چکیده

A design methodology for implementing fast, easily testable arithmetic-logic units (ALU’s) is presented. Here, we describe a set of fast adder designs, which are testable with a test set that has either ( ) complexity (Lin-testable) or (1) complexity (C-testable), where is the input operand size of the ALU. The various levels of testability are achieved by exploiting some inherent properties of carry-lookahead addition. The Lintestable and C-testable ALU designs require only one extra input, regardless of the size of the ALU. The area overhead for a high-speed 64-bit Lintestable ALU is only 0.5%.

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On the design of fast, easily testable ALU's

A design methodology for implementing fast, easily testable arithmetic-logic units (ALU’s) is presented. Here, we describe a set of fast adder designs, which are testable with a test set that has either ( ) complexity (Lin-testable) or (1) complexity (C-testable), where is the input operand size of the ALU. The various levels of testability are achieved by exploiting some inherent properties of...

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تاریخ انتشار 2000